Precise scanning unaffected by material and shape

  • Accurately measure steep slopes and angled surfaces
  • Best-in-class XY resolution ensures even the smallest features are captured
  • No data dropout on transparent or highly-reflective surfaces

High-resolution color observation captures true-to-life images

  • Material texture, shape, and other surface conditions are clearly shown
  • Color images make it possible to instantly determine where to measure
  • High-magnification imaging up to 28,800x offers additional analysis capabilities

292 different measurement tools allows for unsurpassed surface analysis

One system enables diverse analysis from profile measurement to roughness characterization

Measure both flat and uneven surfaces

Millimeter, micrometer, and nanometer measurements in one device

Learn more in the catalog