Laser-based Elemental Analyzer
EA-300 series
Laser-based Elemental Analyzer EA-300 series
Introducing an elemental analyzer for use with VHX-7000 microscopes. Simply place the target on the stage to perform elemental analysis with no destruction, deposition, or vacuum required. AI-based recommendations make it possible for anyone to identify materials or foreign substances.
Features
Identify substances directly from your microscope
Place-and-analyze operation
One-click elemental analysis is possible.
Users can easily go from magnified observation to elemental analysis without needing to re-align or focus the laser objective lens.
No pre-processing or vacuum required
Non-destructive, alteration-free analysis is possible on targets of any size.
No conductivity treatment or vacuuming is required for analysis.
Automatically identify materials
The detected elements are analyzed.
The most likely material is instantly suggested.
An integrated AI function will recommend the most likely detected material.
The database can also be used to collect historical in-house analysis results for reference when similar foreign particles are detected.