Micro-head Spectral-interference Laser Displacement Meter
SI-F series
Micro-head Spectral-interference Laser Displacement Meter SI-F series
Introducing the world’s first micro-head, with the highest measurement accuracy in its class and a level of performance that was previously thought impossible.
Features
Ultra High Resolution 1nm
Spectral Interference Method that enables 1 nm Resolution.
Head Variations That Expand the Range of Possible Measurements
The lineup includes ultra-small, long-range, and other specialized heads to match a variety of applications.
Eliminates the Causes of Measurement Errors
The measurement head consists of only optical fibers and lenses, with no electronic parts.